Abstract:
A statistical analysis of the loss of the despun antenna’s lock for FY-2C satellite is carried out in this paper, based on the satellite data, to investigate the relationship between these events and high energy electrons. By using DICTAT software, the maximum internal electric field is calculated, which is produced by electrons in planar and cylindrical polythene, teflon and epoxy dielectrics. The results show that the loss of despun antenna’s lock for FY-2C satellite is most likely caused by deep dielectric charging due to high energy electrons.