Abstract: To test the life and reliability of swing scanning-type infrared earth sensors, an accelerated life test method is proposed. A sample set for simulating the swing scanning unit is designed, with swing frequency of 55～60 Hz. The stable amplitude oscillation is generated by a sine driving signal. A special test platform is developed, to record and analyze the test data automatically. The test results show that the standard deviation of the swing frequency is less than 0.002 0 Hz, and the standard deviation of the peak-to-peak voltage is less than 0.030 9 V.