Abstract: Due to wide applications of SRAM FPGAs in space missions, the total dose effects and single event effects on their functions are studied in this paper by testing their samples. The results of single events effect test show that at the minimum LET of 1.66 MeV·cm2/mg, the single event upset (SEUs) occurs; at an LET value of 4.17 MeV·cm2/mg, SEFIs occur and the function recovers after reconfiguration of FPGAs. No SEL occurs at LET values between 1.66 and 64.8 MeV·cm2/mg. The power supply current increases as the number of SEUs increases and the power supply current recovers after reconfiguration of FPGAs. The results of total dose test indicate that the two test devices are both functional and exhibit no anomalous change in the power supply current until the dose of 75 krad(Si) is reached. One device fails in its function at a total dose of 87 krad(Si). The tests show that SRAM FPGAs are sensitive to SEU and SEFI. SEUs and SEFIs may cause system failures. The most common mitigation techniques for SRAM FPGA to be reinforced during a space use would be TMR combined with scrubbing.