80C31微处理器单粒子效应敏感性地面试验研究

Study on single event effects on 80C31 microprocessor

摘要: 文章针对不同厂家的80C31微处理器，利用重离子、锎源模拟源进行单粒子效应地面试验研究。详细介绍了80C31微处理器单粒子效应试验原理、试验方法、试验系统的软硬件组成以及试验取得的结论。通过试验研究获得了80C31微处理器单粒子翻转和单粒子锁定特征参数。研究结果可为被测器件在卫星型号的使用提供技术参考依据。

Abstract: This paper investigates single event effects (SEE) of 80C31 microprocessor, using heavy ion accelerator and 252Cf simulation source. The test method, the test system, including both software and hardware, and the experimental results are presented in detail. The single event upset (SEU) and single event latchup (SEL) characteristics of 80C31 microprocessor are identified, which can be useful for selection of such devices in satellites.