临近空间大气中子诱发电子器件单粒子翻转 数值仿真研究

Numerical simulation of single event upset induced by near space atmospheric neutron in electronic components

  • 摘要: 大气中子作为临近空间主要的辐射粒子,能够诱发电子器件发生单粒子翻转效应,严重威胁着临近空间飞行器安全、可靠地工作。文章研究了临近空间大气中子在不同时间、经度、纬度、高度下的能谱,计算了静态存储器(SRAM)中的IMS1601芯片在不同能量各向同性的中子入射下的翻转截面,在国内首次计算出任意两个临近空间位置上飞行器的IMS1601芯片的翻转率,并且对计算结果进行了验证。

     

    Abstract: Atmospheric neutron is one of the major radioactive particles in the near space which seriously threatens the safety of spacecraft at this region. In this paper, the neutron spectra at different periods, longitudes, latitudes, altitudes are studied. For different energies of isotropic incident neutrons, the upset cross section of the static random access memory (SRAM) is calculated. The single event upset (SEU) rate for SRAM during the flight between any two places in the near space is obtained. All calculation results are verified.

     

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