Abstract: High Accelerating Life Test (HALT) is a kind of reliability test with high efficiency. It is used to let the potential defects of products quickly develop into failures through a highly accelerated stress action, and thus to find means to avoid those failures, so that there will be almost no failures during?the operation. This paper discusses the basic principle of this kind of test, the test profile and the failure analysis, and provides steps for determining the stress limit and the methods for temperature control according to the characteristics of spacecraft products. The applications of this test method in typical satellite electronic components are specially addressed.