60 MeV质子位移损伤效应模拟试验装置及辐照试验应用

A 60 MeV proton displacement damage effect simulation facility and its application in radiation testing

  • 摘要: 60 MeV质子位移损伤效应模拟装置(PREF)可提供10~60 MeV范围内连续可调的单能质子束流,具备出色的单色性(能量分散度<2‰)、高均匀性(空间均匀性>90%)以及能量的快速可调(能量切换时间≤10 min)等特点,主要用于模拟空间质子辐射环境对航天器用光电器件与载荷等的位移损伤效应与机理分析。自2023年9月建成以来,PREF已支撑完成多项重要任务中抗辐射模拟器件、高灵敏度光电器件、新一代太阳电池等部件的辐照试验,为星载CMOS图像传感器和卫星电源系统等核心部件提供了关键技术验证。基于PREF平台开展的CMOS图像传感器位移损伤效应试验,获得了不同质子注量下器件暗电流与热像素的退化规律,研究成果为航天器的抗辐射加固设计、在轨可靠性等提供了必不可少的试验支撑。

     

    Abstract: The 60 MeV Proton Radiation Effects Facility (PREF) delivers a monoenergetic proton beam continuously adjustable between 10 MeV and 60 MeV, characterized by excellent monochromaticity (energy spread<2‰), high spatial uniformity (>90%), and rapid energy switching (≤10 min). It is primarily designed to simulate displacement damage effects on spacecraft optoelectronic devices and payloads under space radiation conditions. Since its commissioning in September 2023, PREF has supported multiple irradiation experiments on radiation-hardened devices, high-sensitivity optoelectronic components, and new-generation solar cells. These tests have provided crucial technical validation for on-board CMOS image sensors and satellite power systems. Displacement damage experiments conducted using PREF revealed the degradation behavior of dark current and hot pixels in CMOS sensors under different proton fluences. The findings offer indispensable experimental support for radiation-hardening design and in-orbit reliability assessment of spacecraft systems.

     

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