一种等离子体溯源测量装置设计及性能测试

Design and performance testing of a plasma traceability measurement device

  • 摘要: 文章设计了一套等离子体溯源测量装置为验证感应耦合等离子体(ICP)源作为校准源的性能,找出满足朗缪尔探针溯源校准的最佳等离子体测试条件,提升测试准确性,采用控制变量法对不同工况下ICP源等离子体电子密度和电子温度的稳定性和均匀性,以及电子密度的重复性进行测试。结果表明:在放电开始5~20 min内,等离子体电子密度和电子温度的稳定性分别优于99.4%和98.9%;在探针伸入真空腔体内440~480 mm的范围内,等离子体电子密度和电子温度的均匀性分别优于97.2%和93.6%;在等离子体源放电功率100~900 W范围时,等离子体电子密度的重复性优于86.6%,并且多数在92%以上。本研究可为后续等离子体诊断手段的优化提供参考。

     

    Abstract: A plasma traceability measurement device was designed in this article to verify the performance of the inductively coupled plasma (ICP) as a calibration source. It is to identify the optimal plasma testing conditions that satisfy the traceability calibration of the Langmuir probe, and to improve the test accuracy. The control variable method was used to investigate the stability and uniformity of electron density and electron temperature, the repeatability of electron density of ICP source under different working conditions. The results show that, when the measurement time is within 5-20 min, the stabilities of electron density and electron temperature of plasmas are better than 99.4% and 98.9% respectively. When the probe inserts into the vacuum chamber 440-480 mm, the uniformities of electron density and electron temperature of plasmas are better than 97.2% and 93.6% respectively. When the discharge power of the plasma source is 100-900 W, the repeatability of electron density is better than 86.6%, most of which is superior to 92%. The proposed research may provide a reference for the future optimization of the plasma diagnostic means.

     

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