Abstract:
The establishment of China’s space station provides real in-orbit flight verification conditions for domestic advanced process chips. To realize the verification of different types and models of advanced process domestic chips in space radiation environment, a universal in-orbit verification system was designed. The system adopts a platform architecture of “main control unit + test unit”, as well as a scheme of in-orbit replaceable module and reconfigurable system design, allowing astronauts to regularly complete in-orbit upgrades of chips. This paper describes the hardware design of the system, the software data management mechanism and the in-orbit flight verification results. It is indicated that the proposed design is effective, for with the design, in-orbit monitoring of more than twenty types of domestic chips in ten categories were successfully completed, including the 16 nm FinFET, the 28 nm billion gate FPGA, and the high-speed DAC. This study may provide a reference for the research on the aerospace applicability of domestic advanced process chips.