先进制程芯片在轨飞行验证通用系统设计

Design of a universal system for in-orbit flight verification of advanced process chips

  • 摘要: 中国空间站的建立为国产先进制程芯片提供了真实的在轨飞行验证条件。为实现不同种类、不同型号国产先进制程电子元器件在空间辐射环境中的验证,设计了一种通用的在轨飞行验证系统。系统采用“主控单元+试验单元”的平台架构,运用在轨可更换模块和可重构的系统设计,支持航天员定期在轨更换试验模块以完成验证任务的在轨升级。文中给出系统的硬件设计、软件数据管理机制以及在轨飞行验证结果。结果表明,该系统设计有效,成功完成了16 nm FinFET、28 nm亿门级FPGA、高速DAC等10类20余款国产先进制程芯片的在轨工作监测,可为国产先进制程芯片空间适用性研究提供参考。

     

    Abstract: The establishment of China’s space station provides real in-orbit flight verification conditions for domestic advanced process chips. To realize the verification of different types and models of advanced process domestic chips in space radiation environment, a universal in-orbit verification system was designed. The system adopts a platform architecture of “main control unit + test unit”, as well as a scheme of in-orbit replaceable module and reconfigurable system design, allowing astronauts to regularly complete in-orbit upgrades of chips. This paper describes the hardware design of the system, the software data management mechanism and the in-orbit flight verification results. It is indicated that the proposed design is effective, for with the design, in-orbit monitoring of more than twenty types of domestic chips in ten categories were successfully completed, including the 16 nm FinFET, the 28 nm billion gate FPGA, and the high-speed DAC. This study may provide a reference for the research on the aerospace applicability of domestic advanced process chips.

     

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