Abstract: A certain homemade aerospace SoC device is manufactured by the 55 nm commercial process. The in-depth analysis of radiation vulnerability of this kind of device indicates that the space single-particle effects deserve a special attention. In this paper, the heavy ions from the high-energy accelerator are used to conduct the space single-particle simulation test. It is shown that the LET threshold of the device’s anti-SEL ability is greater than 81.4 MeV·cm²/mg, which meet the requirement for the inflight application. The device is sensitive to the single event upset(SEU) effect. The SEU probability under the SCAN chain mode calculated by the ForeCAST software is 6.80×10^-8 times per day per bit. So it is necessary to take protection measures against the single event upset in orbit applications.