Abstract: The total dose effect is one of the essential factors restricting the space applications of the COTS(commercial off-the-shelf) products. In order to quickly verify the properties of the COTS products against the total dose environment for the low-orbit micro-satellites, a total-dose testing method at board level is proposed, and the entire circuit board or the entire device can be tested in a single test to quickly obtain the total dose resistance of the COTS products, with the efficiency of the test being greatly improved. This method is applied in the total dose validation test for low-orbit micro-satellites, and the verified COTS products show no abnormality in orbit due to the total dose effect.