Abstract: A low-temperature device for the spaceborne CCD test based on the dual-cycle water-cooled semiconductor refrigeration is designed. It is based on a thermoelectric cooler with an anti-saturation PID control algorithm. The precise control of the cooling temperature is achieve by taking an ARM core microcontroller as the main control chip a temperature sensor to collect the temperature information, the adoption of the pulse width modulation (PWM) technology to control the cooling capacity of the thermoelectric cooler, and a water-cooled heat dissipation device used for dissipating the heat generated from the cooler. The device is portable enough to be fixed into the dark chamber for the CCD test. Meanwhile, a light hole in the wall of the device is used for the high-reliable parameter test of the spaceborne CCD both in the light field and in the dark field under the low temperature environment.