Abstract: The paper analyzes some new test requirements for micro/nano satellites according to their typical characteristics, as compared to the traditional test standard and ISO draft standard for micro/nano satellites, and then puts forward a general framework of a fast test system for micro/nano satellites. The idea is based on the traditional satellite test technologies and achievements, combined with the current development of micro/nano satellite in China; the flexibility and reliability requirements of COTS (commercial off-the-shelf) products are also taken into account.