Abstract: As a highly sensitive integrated optoelectronic component, the CCD image sensors are susceptible to space radiation damages, which would result in the performance degradation and anomalies of the CCD devices. It is a prerequisite for the reliable application in a space system to evaluate the radiation response of the CCD devices and to adopt corresponding radiation-hardness strategies. In this paper, an evaluation method by the ground simulation test and the calculation of the radiation shielding is proposed for the ionizing radiation damage and the displacement damage effects of the CCD devices, so that a reference method can be provided to deal with the radiation-hardness design and the on-ground evaluation experiments. The method can also be used to evaluate the radiation effects of other types of optoelectronic devices and materials.