Abstract: SRAM based field-programmable gate array (FPGA) is widely used in the space system in recent years. But single-event upsets (SEUs) can damage the programmable logic and routing and lead to the failure of the entire device. SEU rate is an important parameter to be considered in the radiation hardening design of SRAM based FPGA. In this paper, the predicted SEU rate of Hitachi 4Mb SRAM—M628512 is compared with that observed on the Advanced Components Experiment on the SAC-C polar orbit satellite. It is shown that the predicted SEU rate based on the domestic experimental data and the method of figure of merit (FOM) is close to that observed in orbit. The studies on the single event effect experiment techniques and the orbital rate prediction provide support to the radiation hardening design of spacecraft electronic system in China.